-
[1]
McKay K G, McAfee K B. Phys. Rev., 1953, 91: 1079-1084[2] Dicello J F, Wasiolek M, Zaider M. IEEE Trans. Nucl. Sci., 1991, 38: 1203-1209[3] Stapor W J, McDonald P T, Knudson A R et al. IEEE Trans. Nucl. Sci., 1988, 35: 1585-1590[4] Dodd P E, Schwank J R, Shaneyfelt M R et al. IEEE Trans. Nucl. Sci., 2007, 54: 889-893[5] Dodd P E, Schwank J R, Shaneyfelt M R et al. IEEE Trans. Nucl. Sci., 2007, 54: 2303-2311[6] Warren K M, Weller R A, Mendenhall M H et al. IEEE Trans. Nucl. Sci., 2005, 52: 2125-2131[7] Reed R A, Weller R A, Mendenhall M H et al. IEEE Trans. Nucl. Sci., 2007, 54: 2312-2321[8] Weller R A, Reed R A, Warren K M et al. IEEE Trans. Nucl. Sci., 2009, 56: 3098-3108[9] Weller R A, Schrimpf R D, Reed R A et al. IEEE Trans. Nucl. Sci., 2010, 57: 1726-1746[10] Agostinelli S, Allison J, Amako K et al. Nucl. Instrum. Methods Phys. Res. A, 2003, 506: 250-303[11] Huhtinen M, Faccio F. Nucl. Instrum. Methods Phys. Res. A, 2000, 450: 155-172[12] Warren K M. Sensitive Volume Models for Single Event Upset Analysis and Rate Prediction for Space, Atmospheric, and Terrestrial Radiation Environment (Ph. D Thesis). Tennessee: Vanderbilt University, 2010[13] Ball D R, Warren K M, Weller R A et al. IEEE. Trans. Nucl. Sci., 2006, 53: 1794-1798[14] Loke A L S. Process Integration Issues of Low-Permittivity Dielectrics with Copper for High-Performance Interconnects (Ph. D Thesis). Stanford: Stanford University, 1999[15] Shockley W. Solid State Elec., 1961, 2: 35-67[16] Cucinotta F A, Katz R, Wilson J W et al. Faculty Publications, Dept of Physics and Astronomy, 1996, 62[17] Waligorski M P R, Hamm R N, Katz R. Int. J. Raiat. Inst., 1986, 11: 309-319