Impact factor of Chinese Physics C is 3.6 in 2023 Impact factor of Chinese Physics C is 3.6 in 2022 2021 Impact Factor 2.944
Advanced Search
×
近期发现有不法分子冒充我刊与作者联系，借此进行欺诈等不法行为，请广大作者加以鉴别，如遇诈骗行为，请第一时间与我刊编辑部联系确认（《中国物理C》（英文）编辑部电话：010-88235947,010-88236950），并作报警处理。
本刊再次郑重声明：
（1）本刊官方网址为cpc.ihep.ac.cn和https://iopscience.iop.org/journal/1674-1137
（2）本刊采编系统作者中心是投稿的唯一路径，该系统为ScholarOne远程稿件采编系统，仅在本刊投稿网网址（https://mc03.manuscriptcentral.com/cpc）设有登录入口。本刊不接受其他方式的投稿，如打印稿投稿、E-mail信箱投稿等，若以此种方式接收投稿均为假冒。
（3）所有投稿均需经过严格的同行评议、编辑加工后方可发表，本刊不存在所谓的“编辑部内部征稿”。如果有人以“编辑部内部人员”名义帮助作者发稿，并收取发表费用，均为假冒。
                  
《中国物理C》（英文）编辑部
2024年10月30日
Chinese Physics C> 2017, Vol. 41> Issue(4) : 046003 DOI: 10.1088/1674-1137/41/4/046003

A highly pixelated CdZnTe detector based on Topmetal-II- sensor

  • Topmetal-Ⅱ- is a low noise CMOS pixel direct charge sensor with a pitch of 83 μm. CdZnTe is an excellent semiconductor material for radiation detection. The combination of CdZnTe and the sensor makes it possible to build a detector with high spatial resolution. In our experiments, an epoxy adhesive is used as the conductive medium to connect the sensor and cadmium zinc telluride (CdZnTe). The diffusion coefficient and charge efficiency of electrons are measured at a low bias voltage of -2 V, and the image of a single alpha particle is clear with a reasonable spatial resolution. A detector with such a structure has the potential to be applied in X-ray imaging systems with further improvements of the sensor.
      PCAS:
  • 加载中

  • References

    [1] M. McCleskey, W. Kaye, D. S. Mackin et al, Nucl. Instrum. Methods A, 785:163-169 (2015)
    [2] T. Liu, T. Kutter, J. Miyamoto, Phys. Procedia, 37:1223-1230 (2012)
    [3] A. Niemela, H. Sipila, IEEE Trans. Nucl. Sci., 41(4):1054-1057 (1994)
    [4] Q. Li, M. Beilicke, K. Lee et al, Astropart. Phys., 34(10):769-777 (2011)
    [5] K. Lee, A. Bolotnikov, S. Bae et al, IEEE Trans. Nucl. Sci., 61(5):2567-2572 (2014)
    [6] Y. D. Ma, S. L. Xiao, G. Q. Yang et al, Appl. Radiat. Isot., 94:314-318 (2014)
    [7] A. E. Bolotnikov, W. R. Cook, S. E. Boggs et al, Nucl. Instrum. Methods A, 458(1-2):585-592 (2001)
    [8] T. Liu, Y. Z. Yin, X. M. Chen et al, Phys. Procedia, 37:1537-1545 (2012)
    [9] M. Voelker, J. Hauer, J. M. Benlloch et al, Microelectr. J., 45(10):1275-1280 (2014)
    [10] Y. Z. Yin, Q. Liu, D. P. Xu et al, Chin. Phys. C, 38(11):116002 (2014)
    [11] J. C. Kim, S. E. Anderson, W. Kaye et al, Nucl. Instrum. Methods A, 654(1):233-243, (2011)
    [12] M. M. An, C. F. Chen, C. S. Gao et al, Nucl. Instrum. Methods A, 810:144-150 (2016)
    [13] S. G. Zou, Y. Fan, M. M. An et al, Nucl. Instrum. Methods A, 830:275-278 (2016)

  • Access

    加载中

Get Citation
null. A highly pixelated CdZnTe detector based on Topmetal-II- sensor[J]. Chinese Physics C, 2017, 41(4): 046003. doi: 10.1088/1674-1137/41/4/046003
null. A highly pixelated CdZnTe detector based on Topmetal-II- sensor[J]. Chinese Physics C, 2017, 41(4): 046003.  doi: 10.1088/1674-1137/41/4/046003 shu
Milestone
Received: 2016-11-11
Fund

    Supported by National Natural Science Foundation of China (11375073, 11305072, U1232206)

Article Metric

Article Views(1498)
PDF Downloads(25)
Cited by(0)
Policy on re-use
To reuse of subscription content published by CPC, the users need to request permission from CPC, unless the content was published under an Open Access license which automatically permits that type of reuse.
通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

  1. 本站搜索
  2. 百度学术搜索
  3. 万方数据库搜索
  4. CNKI搜索

Email This Article

Title:
Email:

A highly pixelated CdZnTe detector based on Topmetal-II- sensor

  • Received Date: 2016-11-11
  • Available Online: 2017-04-05
Fund Project:  Supported by National Natural Science Foundation of China (11375073, 11305072, U1232206)

Abstract: Topmetal-Ⅱ- is a low noise CMOS pixel direct charge sensor with a pitch of 83 μm. CdZnTe is an excellent semiconductor material for radiation detection. The combination of CdZnTe and the sensor makes it possible to build a detector with high spatial resolution. In our experiments, an epoxy adhesive is used as the conductive medium to connect the sensor and cadmium zinc telluride (CdZnTe). The diffusion coefficient and charge efficiency of electrons are measured at a low bias voltage of -2 V, and the image of a single alpha particle is clear with a reasonable spatial resolution. A detector with such a structure has the potential to be applied in X-ray imaging systems with further improvements of the sensor.

    HTML

Reference (13)

目录

Link
IOPScience
SCOAP3
arXiv
Chinese Physical Society
Journal information
Introduction
Editorial Board
Others
Subscribe
Contact us
QQ: 1307685413
Tel: +86-010-88235947
Fax: +86-010-88233126
E-mail: cpc@ihep.ac.cn

  • CPC Website

  • IOP Website

  • CPC WeChat

Copyright © Institute of High Energy Physics, Chinese Academy of Sciences, 19B Yuquan Road, Beijing 100049, China 京ICP备05002789号-1

Supported by: Beijing Renhe Information Technology Co. Ltd  E-mail: info@rhhz.net

/

DownLoad:  Full-Size Img  PowerPoint
Return
Return