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Chinese Physics C> 2016, Vol. 40> Issue(6) : 066001 DOI: 10.1088/1674-1137/40/6/066001

Monte Carlo predictions of proton SEE cross-sections from heavy ion test data

  • 1.

     Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China

  • 2.

     University of Chinese Academy of Sciences, Beijing 100049, China

  • 3.

      Academy of Shenzhen State Microelectronics Co., Ltd., Shenzhen 518057, China

  • 4.

      Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, ChinaElectronic Product Reliability and Environmental Testing Research Institute, Guangzhou 510610, China

  • 5.

      Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China

  • The limits of previous methods prompt us to design a new approach (named PRESTAGE) to predict proton single event effect (SEE) cross-sections using heavy-ion test data. To more realistically simulate the SEE mechanisms, we adopt Geant4 and a location-dependent strategy to describe the physics processes and the sensitivity of the device. Cross-sections predicted by PRESTAGE for over twenty devices are compared with the measured data. Evidence shows that PRESTAGE can calculate not only single event upsets induced by indirect proton ionization, but also direct ionization effects and single event latch-ups. Most of the PRESTAGE calculated results agree with the experimental data within a factor of 2-3.

  • References

    [1] Y. Xiao, H. X. Guo, F. Q. Zhang et al, Chin. Phys. B, 23:118503(2014)
    [2] Z. F. Lei, H. X. Guo, C. Zeng et al, Chin. Phys. B, 24:056103(2015)
    [3] S. M. Chen and J. J. Chen, Chin. Phys. B,21:016104(2012)
    [4] D. F. Heidel, P. W. Marshall, K. A. LaBel et al, IEEE Trans. Nucl. Sci., 55:3394(2008)
    [5] J. R. Schwank, M. R. Shaneyfelt, V. F. Cavrois et al, IEEE Trans. Nucl. Sci., 59:1197(2012)
    [6] E. Normand, IEEE Trans. Nucl. Sci., 45:2904(1998)
    [7] E. L. Petersen, IEEE Trans. Nucl. Sci., 39:1600(1992)
    [8] P. Calvel, C. Barillot, P. Lamothe et al, IEEE Trans. Nucl. Sci., 43: 2827(1996)
    [9] J. Barak, IEEE Trans. Nucl. Sci., 53:3336(2006)
    [10] C. C. Foster, P. L. O'Neill and C. K. Kouba, IEEE Trans. Nucl. Sci., 53:3494(2006)
    [11] L. D. Edmonds, IEEE Trans. Nucl. Sci., 47:1713(2000)
    [12] S. Agostinelli, J. Allisonas, K. Amakoe et al, Nuclear Instruments and Methods in Physics Research A, 506:250(2003)
    [13] J. Allison, K. Amako, J. Apostolakis et al. IEEE Trans. Nucl. Sci., 53:270(2006)
    [14] ECSS-E-ST-10-12C:Methods for the calculation of radiation received and its effects and a policy for design margins. 2008
    [15] J. R. Schwank, M. R. Shaneyfelt and P. E. Dodd, IEEE Trans. Nucl. Sci., 60:2074(2013)
    [16] R. C. Alia, M. Brugger, S. Danzeca et al, IEEE Trans. Nucl. Sci. 61:2718(2014)
    [17] C. Inguimbert, S. Duzellier, R. Ecoffet et al, IEEE Trans. Nucl. Sci., 47:551(2000)
    [18] E. L. Petersen, J. C. Pickel, J. H. Adamset al, IEEE Trans. Nucl. Sci., 39:1577(1992)
    [19] P. L. Petersen, V. Pouget, L. W. Massengill et al, IEEE Trans. Nucl. Sci., 52:2158(2005)
    [20] R. Koga, J. George, G. Swift et al, IEEE Trans. Nucl. Sci., 51:2825(2004)
    [21] E. H. Cannon, M. C. Holmen, J. Wert et al, IEEE Trans. Nucl. Sci., 57:3493(2010)
    [22] E. Normand, IEEE Trans. Nucl. Sci., 51:3494(2004)
    [23] A. H. Johnston and G. M. Swift, IEEE Trans. Nucl. Sci., 44:2367(1997)
    [24] J. R. Schwank, M. R. Shaneyfelt and P. E. Dodd,IEEE Trans. Nucl. Sci., 60:2101(2013)

  • References

    [1] Y. Xiao, H. X. Guo, F. Q. Zhang et al, Chin. Phys. B, 23:118503(2014)
    [2] Z. F. Lei, H. X. Guo, C. Zeng et al, Chin. Phys. B, 24:056103(2015)
    [3] S. M. Chen and J. J. Chen, Chin. Phys. B,21:016104(2012)
    [4] D. F. Heidel, P. W. Marshall, K. A. LaBel et al, IEEE Trans. Nucl. Sci., 55:3394(2008)
    [5] J. R. Schwank, M. R. Shaneyfelt, V. F. Cavrois et al, IEEE Trans. Nucl. Sci., 59:1197(2012)
    [6] E. Normand, IEEE Trans. Nucl. Sci., 45:2904(1998)
    [7] E. L. Petersen, IEEE Trans. Nucl. Sci., 39:1600(1992)
    [8] P. Calvel, C. Barillot, P. Lamothe et al, IEEE Trans. Nucl. Sci., 43: 2827(1996)
    [9] J. Barak, IEEE Trans. Nucl. Sci., 53:3336(2006)
    [10] C. C. Foster, P. L. O'Neill and C. K. Kouba, IEEE Trans. Nucl. Sci., 53:3494(2006)
    [11] L. D. Edmonds, IEEE Trans. Nucl. Sci., 47:1713(2000)
    [12] S. Agostinelli, J. Allisonas, K. Amakoe et al, Nuclear Instruments and Methods in Physics Research A, 506:250(2003)
    [13] J. Allison, K. Amako, J. Apostolakis et al. IEEE Trans. Nucl. Sci., 53:270(2006)
    [14] ECSS-E-ST-10-12C:Methods for the calculation of radiation received and its effects and a policy for design margins. 2008
    [15] J. R. Schwank, M. R. Shaneyfelt and P. E. Dodd, IEEE Trans. Nucl. Sci., 60:2074(2013)
    [16] R. C. Alia, M. Brugger, S. Danzeca et al, IEEE Trans. Nucl. Sci. 61:2718(2014)
    [17] C. Inguimbert, S. Duzellier, R. Ecoffet et al, IEEE Trans. Nucl. Sci., 47:551(2000)
    [18] E. L. Petersen, J. C. Pickel, J. H. Adamset al, IEEE Trans. Nucl. Sci., 39:1577(1992)
    [19] P. L. Petersen, V. Pouget, L. W. Massengill et al, IEEE Trans. Nucl. Sci., 52:2158(2005)
    [20] R. Koga, J. George, G. Swift et al, IEEE Trans. Nucl. Sci., 51:2825(2004)
    [21] E. H. Cannon, M. C. Holmen, J. Wert et al, IEEE Trans. Nucl. Sci., 57:3493(2010)
    [22] E. Normand, IEEE Trans. Nucl. Sci., 51:3494(2004)
    [23] A. H. Johnston and G. M. Swift, IEEE Trans. Nucl. Sci., 44:2367(1997)
    [24] J. R. Schwank, M. R. Shaneyfelt and P. E. Dodd,IEEE Trans. Nucl. Sci., 60:2101(2013)

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Cited by

1. Han, J., Guo, G., Ma, X. et al. Comparison of the Proton and Neutron SEE Cross Sections for Devices with High LET Thresholds[J]. IEEE Transactions on Nuclear Science, 2025. doi: 10.1109/TNS.2025.3530254
2. Han, J., Guo, G., Liu, J. et al. A new model for predicting proton SEE cross sections based on heavy ion data[J]. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 2022. doi: 10.1016/j.nimb.2022.07.001
3. Hansen, D.L., Czajkowski, D., Vermeire, B. Proton Cross-Sections from Heavy-Ion Data: A Review of the Models[J]. IEEE Transactions on Nuclear Science, 2022, 69(7): 1475-1484. doi: 10.1109/TNS.2021.3131910
4. Luo, Y.-H., Zhang, F.-Q., Guo, H.-X. et al. Prediction of proton single event upset sensitivity based on heavy ion test data in nanometer hardened static random access memory | [基于重离子试验数据预测纳米加固静态随机存储器质子单粒子效应敏感性][J]. Wuli Xuebao/Acta Physica Sinica, 2020, 69(1): 018501. doi: 10.7498/aps.69.20190878
5. Yang, W.-T., Yin, Q., Li, Y. et al. Single-event effects induced by medium-energy protons in 28 nm system-on-chip[J]. Nuclear Science and Techniques, 2019, 30(10): 151. doi: 10.1007/s41365-019-0672-5
6. Samwel, S.W., El-Aziz, E.A., Garrett, H.B. et al. Space radiation impact on smallsats during maximum and minimum solar activity[J]. Advances in Space Research, 2019, 64(1): 239-251. doi: 10.1016/j.asr.2019.03.025
7. Cao, X.-B., Xiao, L.-Y., Huo, M.-X. et al. Heavy ion-induced single event upset sensitivity evaluation of 3D integrated static random access memory[J]. Nuclear Science and Techniques, 2018, 29(3): 31. doi: 10.1007/s41365-018-0377-1
8. Xi, K., Bi, J., Liu, M. et al. Sensitivity of proton single event effect simulation tool to variation of input parameters[J]. 2016. doi: 10.1109/ICSICT.2016.7998691
Get Citation
Kai Xi, Chao Geng, Zhan-Gang Zhang, Ming-Dong Hou, You-Mei Sun, Jie Luo, Tian-Qi Liu, Bin Wang, Bing Ye, Ya-Nan Yin and Jie Liu. Monte Carlo predictions of proton SEE cross-sections from heavy ion test data[J]. Chinese Physics C, 2016, 40(6): 066001. doi: 10.1088/1674-1137/40/6/066001
Kai Xi, Chao Geng, Zhan-Gang Zhang, Ming-Dong Hou, You-Mei Sun, Jie Luo, Tian-Qi Liu, Bin Wang, Bing Ye, Ya-Nan Yin and Jie Liu. Monte Carlo predictions of proton SEE cross-sections from heavy ion test data[J]. Chinese Physics C, 2016, 40(6): 066001.  doi: 10.1088/1674-1137/40/6/066001 shu
Milestone
Received: 2015-11-30
Revised: 2016-02-06
Fund

    Supported by National Natural Science Foundation of China (11179003, 10975164, 10805062, 11005134)

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Monte Carlo predictions of proton SEE cross-sections from heavy ion test data

    Corresponding author: Jie Liu,
  • 1. Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China
  • 2. University of Chinese Academy of Sciences, Beijing 100049, China
  • 3.  Academy of Shenzhen State Microelectronics Co., Ltd., Shenzhen 518057, China
  • 4.  Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, ChinaElectronic Product Reliability and Environmental Testing Research Institute, Guangzhou 510610, China
  • 5.  Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China
  • Received Date: 2015-11-30
  • Accepted Date: 2016-02-06
  • Available Online: 2016-06-05
Fund Project:  Supported by National Natural Science Foundation of China (11179003, 10975164, 10805062, 11005134)

Abstract: The limits of previous methods prompt us to design a new approach (named PRESTAGE) to predict proton single event effect (SEE) cross-sections using heavy-ion test data. To more realistically simulate the SEE mechanisms, we adopt Geant4 and a location-dependent strategy to describe the physics processes and the sensitivity of the device. Cross-sections predicted by PRESTAGE for over twenty devices are compared with the measured data. Evidence shows that PRESTAGE can calculate not only single event upsets induced by indirect proton ionization, but also direct ionization effects and single event latch-ups. Most of the PRESTAGE calculated results agree with the experimental data within a factor of 2-3.

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