Measurement and Calculation of Escape Peak in SR-XRF Analysis

KANG Shi-Xiu; SUN Xia; YAO Kun; WU Zi-Qin; HUANG Yu-Ying; JU Xin; XIAN Ding-Chang

Chinese Physics C> 2001, Vol. 25> Issue(S1) : 39-43

Measurement and Calculation of Escape Peak in SR-XRF Analysis

Department of Astronomy and Applied Physics,University of Science and Technology of China,Hefei 230026,China2 Institute of High Energy Physics,CAS,Beijing 100039,China

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Abstract：
The escape peaks in synchrotron radiation X-ray fluorescence (SR-XRD) spectra generating from Si(Li) detector can disrupt seriously the qualitative and quantitative analysis.Discrimination to escape peaks in experiments was performed.The escape peak position and intensity of 12 elements from K K_α to As K_α,for each of the 14 specimens,are measured.The differences of standard and experimental values of escape peak and the nearest major peak are compared.The errors are less than 10% in general.The ratios of intensity of escape peak and major peak are calculated using a simplified emitting distribution model of Si K_α excited by X-ray.The ratios,both calculated and experimental,descend approximately from 1% to 0.1% with the atom ordinal number increasing.

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KANG Shi-Xiu, SUN Xia, YAO Kun, WU Zi-Qin, HUANG Yu-Ying, JU Xin and XIAN Ding-Chang. Measurement and Calculation of Escape Peak in SR-XRF Analysis[J]. Chinese Physics C, 2001, 25(S1): 39-43.

KANG Shi-Xiu, SUN Xia, YAO Kun, WU Zi-Qin, HUANG Yu-Ying, JU Xin and XIAN Ding-Chang. Measurement and Calculation of Escape Peak in SR-XRF Analysis[J]. Chinese Physics C, 2001, 25(S1): 39-43. shu

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Received: 1900-01-01
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通讯作者: 陈斌, bchen63@163.com

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沈阳化工大学材料科学与工程学院沈阳 110142

Measurement and Calculation of Escape Peak in SR-XRF Analysis

Corresponding author: KANG Shi-Xiu,

Department of Astronomy and Applied Physics,University of Science and Technology of China,Hefei 230026,China2 Institute of High Energy Physics,CAS,Beijing 100039,China

Received Date: 1900-01-01

Accepted Date: 1900-01-01

Available Online: 2001-06-22

Abstract: The escape peaks in synchrotron radiation X-ray fluorescence (SR-XRD) spectra generating from Si(Li) detector can disrupt seriously the qualitative and quantitative analysis.Discrimination to escape peaks in experiments was performed.The escape peak position and intensity of 12 elements from K K_α to As K_α,for each of the 14 specimens,are measured.The differences of standard and experimental values of escape peak and the nearest major peak are compared.The errors are less than 10% in general.The ratios of intensity of escape peak and major peak are calculated using a simplified emitting distribution model of Si K_α excited by X-ray.The ratios,both calculated and experimental,descend approximately from 1% to 0.1% with the atom ordinal number increasing.

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Measurement and Calculation of Escape Peak in SR-XRF Analysis

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