Diffraction Radiation and Its Applications in Electron Beam Diagnostics

XIANA Dao; HUANG Wen-Hui

Chinese Physics C> 2006, Vol. 30> Issue(S1) : 75-77

Diffraction Radiation and Its Applications in Electron Beam Diagnostics

XIANA Dao ^, ,
HUANG Wen-Hui

Department of Engineering Physics, Tsinghua University, Beijing 100084, China

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Abstract：
Diffraction radiation is generated when there are optical inhomogeneities in the presence of which would cause induced currents that give rise to radiation. Diffraction radiation is the most promising candidate for beam characterizations for the 4th generation light source and the next generation linear colliders due to its non-intercepting and multi-parameter features. In this paper, we gave a brief introduction to the principles of diffraction radiation and systematically studied its applications in electron beam diagnostics.

References

[1]

. Ter-Mikaelian M L. High-Energy Electromagnetic Processesin Condensed Media, wiley/Interscience, 19722. Potylitsyn A P. NIM, 1998, B145: 1693. XIANG Dao, HUANG Wen-Hui. NIM, 2005, A553: 3814. Yamamoto Y et al. NIM, 2001, A467—468: 9215. Castellano M. NIM, 1997, A394: 2756. Karataev P et al. Phys. Rev. Lett, 2004, 93: 2448027. Born M, Wolf E. Principles of Optics, 5th Edition8. Lebedev V A. NIM, 1996, A372: 3449. Wiedemann H. Particle Accelerator Physics, 31810. XIANG Dao, HUANG Wen-Hui. NIM, 2005, B240: 85511. Hung-Chi Lihn et al. Phy. Rev., 1996, E53: 641312. Lumpkin A H et al. NIM, 2001, A475: 470

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XIANA Dao and HUANG Wen-Hui. Diffraction Radiation and Its Applications in Electron Beam Diagnostics[J]. Chinese Physics C, 2006, 30(S1): 75-77.

XIANA Dao and HUANG Wen-Hui. Diffraction Radiation and Its Applications in Electron Beam Diagnostics[J]. Chinese Physics C, 2006, 30(S1): 75-77. shu

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Received: 2005-12-07
Revised: 1900-01-01

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沈阳化工大学材料科学与工程学院沈阳 110142

Diffraction Radiation and Its Applications in Electron Beam Diagnostics

XIANA Dao ^,
HUANG Wen-Hui

Corresponding author: XIANA Dao,

Department of Engineering Physics, Tsinghua University, Beijing 100084, China

Received Date: 2005-12-07
Accepted Date: 1900-01-01
Available Online: 2006-01-04

Abstract: Diffraction radiation is generated when there are optical inhomogeneities in the presence of which would cause induced currents that give rise to radiation. Diffraction radiation is the most promising candidate for beam characterizations for the 4th generation light source and the next generation linear colliders due to its non-intercepting and multi-parameter features. In this paper, we gave a brief introduction to the principles of diffraction radiation and systematically studied its applications in electron beam diagnostics.