Microstructural Characterization of YBCO Thin Films Grown on YSZ

LIU Cui-Xiu; CHEN Xiang-Ming; TANG Wei-Hua; WANG Yong; XU Ming; MAI Zhen-Hong; JIA Quan-Jie; ZHENG Wen-Li; JIANG Xiao-Ming; GAO Ju

Chinese Physics C> 2001, Vol. 25> Issue(S1) : 96-99

Microstructural Characterization of YBCO Thin Films Grown on YSZ

Institute of Physicss,The Chinese Academy of Sciences,Beijing 100080,China2 Department of Physics,The University of Hong Kong,Pokfulam Road,Hong Kong,China3 Institute of High Energy Physics,The Chinese Academy of Sciences,Beijing 100039,China

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Abstract：
Ultrathin films of YBa₂Cu₃O_7-σ with good crystallinity and superconductivity were prepared by a modified off-axis sputtering with an Eu₂CuO₄ buffer layer.The microstructure of YBCO thin films with or without buffer layer,were studied by using scanning electron microscopy and X-ray techniques.It was found that the epitaxy and crystallinity of the grown YBCO have been significantly enhanced by using the ECO buffer layer,and the surface of the YBCO films with buffer is more smooth.The results also show that the ECO buffer can efficiently block the interaction between YBCO and yttria stabilized ZrO₂ substrate.

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LIU Cui-Xiu, CHEN Xiang-Ming, TANG Wei-Hua, WANG Yong, XU Ming, MAI Zhen-Hong, JIA Quan-Jie, ZHENG Wen-Li, JIANG Xiao-Ming and GAO Ju. Microstructural Characterization of YBCO Thin Films Grown on YSZ[J]. Chinese Physics C, 2001, 25(S1): 96-99.

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Received: 1900-01-01
Revised: 1900-01-01

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